TEM Application field of silicon nitride film window

TEM silicon nitride membrane window is a sample carrier net for transmission electron microscopy (TEM), using nitrogen-silicon film as the window material. This silicon nitride membrane window has the advantages of high transmittance, low deformation, low stress, high temperature resistance, corrosion resistance, etc., which can meet the high-resolution observation requirements of various samples under TEM.

In terms of biological sample observation, silicon nitride membrane window has good biological affinity and can be used as a carrier for biological samples such as cells, viruses, proteins, etc. for high-resolution observation under electron microscopy. At the same time, nitrogen-silicon film also has high chemical stability and can withstand various chemical treatments, such as acids, alkalis, salts, etc., so it can be used for various complex sample preparation and observation.

In the field of materials science, silicon nitride membrane window can be used to observe the nanostructure and crystal orientation of metals, ceramics, polymers and other materials, providing powerful support for material performance and optimization.

In addition, silicon nitride membrane window can also be used for sample observation of atomic force microscopy (AFM), Raman spectrometers and X-ray diffraction (XRD), etc., which has a wide application prospects.

In summary, TEM silicon nitride membrane window, as an advanced sample carrier material, play an important role in the research of biology, materials, physics, chemistry and other fields.